Materials analysis under defined climate conditions with KLIMATOM
The Fraunhofer ISC´s Center of Device Development CeDeD has evolved a new analytical device for in-situ characterization of materials and material combinations with climate change conditions: KLIMATOM. In a unique way the KLIMATOM enables a non-contact and non-destructive contour analysis of different materials, whereby the shadow image of the sample is investigated.
Furthermore, it is possible to analyze in-situ material changes of transparent and translucent surfaces using transmitted light. In this occasion dimensional changes within defined temperature and humidity ranges can be measured and images in high-resolution CMOS technology can be obtained.